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Structural, Syntactic, and Statistical Pattern Recognition: Joint Iapr International Workshop, Sspr & Spr 2012, Hiroshima, Japan, November 7-9, 2012,

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Book Details

Dimensions
Width 6.12 inch
Height 1.53 inch
Weight 1084 g
Format
Binding Paperback
Overview
Number of Pages 755 Pages
Series Name "Lecture Notes in Computer Science / Image Processing, Computer Vision, Pattern Recognition, and Graphics"
Publisher Springer
Publication Year 2012
ISBN-13 9783642341656
ISBN-10 3642341659
Language English

Structural, Syntactic, and Statistical Pattern Recognition: Joint Iapr International Workshop, Sspr & Spr 2012, Hiroshima, Japan, November 7-9, 2012, Price in India

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