Home > > > Angewandte Oberflachenanalyse Mit Sims Sekundar-Ionen-Massenspektrometrie AES Auger-Elektronen-Spektrometrie XPS Rontgen-Photoelektronen-Spektrometrie (German)

Angewandte Oberflachenanalyse Mit Sims Sekundar-Ionen-Massenspektrometrie AES Auger-Elektronen-Spektrometrie XPS Rontgen-Photoelektronen-Spektrometrie (German)

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Book Details

Contributors
Author "M. Grasserbauer, H. J. Dudek, Maria F. Ebel"
Dimensions
Width 6.69 inch
Height 0.67 inch
Weight 503 g
Format
Binding Paperback
Overview
Publisher Springer
Publication Year 2012
ISBN-13 9783642701788
ISBN-10 3642701787
Language German
Edition Softcover reprint of the original 1st ed. 1986th
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Angewandte Oberflachenanalyse Mit Sims Sekundar-Ionen-Massenspektrometrie AES Auger-Elektronen-Spektrometrie XPS Rontgen-Photoelektronen-Spektrometrie (German) Price in India

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