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Device Characterization of Dy-Incorporated Hfo2 Gate Oxide Nmos Device

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Book Details

Contributors
Author Tackhwi Lee
Dimensions
Width 5.98 inch
Height 0.31 inch
Weight 209 g
Format
Binding Paperback
Overview
Number of Pages 136 Pages
Publisher Lap Lambert Academic Publishing
Publication Year 2011
ISBN-13 9783844393422
ISBN-10 3844393420
Language English
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