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Performance and Reliability of Semiconductor Devices

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Book Details

Contributors
Author Edited By Michael Mastro Jeffrey LaRoche Fan Ren Jen-Inn Chyi Jihyun Kim
Dimensions
Width 6.10 inch
Height 0.79 inch
Weight 476 g
Format
Binding Hardcover
Overview
Number of Pages 259 Pages
Series Name MRS Proceedings
Publisher Cambridge University Press
Publication Year 2009
ISBN-13 9781605110806
ISBN-10 1605110809
Language English
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