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Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, SSPR & SPR 2008, Orlando, USA, December 4-6, 2008 ; Proceedings

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Binding	Paperback
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Publisher	Springer-Verlag Berlin and Heidelberg GmbH & Co. KG

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Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, SSPR & SPR 2008, Orlando, USA, December 4-6, 2008 ; Proceedings Price in India

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